● Home ● Random ● Nearby ● Log in ● Settings ● Donate ● About Wikipedia ● Disclaimers

List of materials analysis methods

● Article ● Talk ● Language ● Watch ● Edit (Redirected from List of surface analysis methods)

This is a list of analysis methods used in materials science. Analysis methods are listed by their acronym, if one exists.

A

B

C

D

E

F

G

H

I

K

L

M

N

O

P

Q

R

S

T

U

V

W

X

Symbols

μSR – see muon spin spectroscopy
χ – see magnetic susceptibility

A

AAS – Atomic absorption spectroscopy
AED – Auger electron diffraction
AES – Auger electron spectroscopy
AFM – Atomic force microscopy
AFS – Atomic fluorescence spectroscopy
Analytical ultracentrifugation
APFIM – Atom probe field ion microscopy
APS – Appearance potential spectroscopy
ARPES – Angle resolved photoemission spectroscopy
ARUPS – Angle resolved ultraviolet photoemission spectroscopy
ATR – Attenuated total reflectance

B

BET – BET surface area measurement (BET from Brunauer, Emmett, Teller)
BiFC – Bimolecular fluorescence complementation
BKD – Backscatter Kikuchi diffraction, see EBSD
BRET – Bioluminescence resonance energy transfer
BSED – Back scattered electron diffraction, see EBSD

C

CAICISS – Coaxial impact collision ion scattering spectroscopy
CARS – Coherent anti-Stokes Raman spectroscopy
CBED – Convergent beam electron diffraction
CCM – Charge collection microscopy
CDI – Coherent diffraction imaging
CE – Capillary electrophoresis
CET – Cryo-electron tomography
CL – Cathodoluminescence
CLSM – Confocal laser scanning microscopy
COSY – Correlation spectroscopy
Cryo-EM – Cryo-electron microscopy
Cryo-SEM – Cryo-scanning electron microscopy
CV – Cyclic voltammetry

D

DE(T)A – Dielectric thermal analysis
dHvA – De Haas–van Alphen effect
DIC – Differential interference contrast microscopy
Dielectric spectroscopy
DLS – Dynamic light scattering
DLTS – Deep-level transient spectroscopy
DMA – Dynamic mechanical analysis
DPI – Dual polarisation interferometry
DRS – Diffuse reflection spectroscopy
DSC – Differential scanning calorimetry
DTA – Differential thermal analysis
DVS – Dynamic vapour sorption

E

EBIC – Electron beam induced current (see IBIC: ion beam induced charge)
EBS – Elastic (non-Rutherford) backscattering spectrometry (see RBS)
EBSD – Electron backscatter diffraction
ECOSY – Exclusive correlation spectroscopy
ECT – Electrical capacitance tomography
EDAX – Energy-dispersive analysis of x-rays
EDMR – Electrically detected magnetic resonance, see ESR or EPR
EDS or EDX – Energy dispersive X-ray spectroscopy
EELS – Electron energy loss spectroscopy
EFTEM – Energy filtered transmission electron microscopy
EID – Electron induced desorption
EIT and ERT – Electrical impedance tomography and electrical resistivity tomography
EL – Electroluminescence
Electron crystallography
ELS – Electrophoretic light scattering
ENDOR – Electron nuclear double resonance, see ESR or EPR
EPMA – Electron probe microanalysis
EPR – Electron paramagnetic resonance spectroscopy
ERD or ERDA – Elastic recoil detectionorelastic recoil detection analysis
ESCA – Electron spectroscopy for chemical analysis see XPS
ESD – Electron stimulated desorption
ESEM – Environmental scanning electron microscopy
ESI-MS or ES-MS – Electrospray ionization mass spectrometry or electrospray mass spectrometry
ESR – Electron spin resonance spectroscopy
ESTM – Electrochemical scanning tunneling microscopy
EXAFS – Extended X-ray absorption fine structure
EXSY – Exchange spectroscopy

F

FCS – Fluorescence correlation spectroscopy
FCCS – Fluorescence cross-correlation spectroscopy
FEM – Field emission microscopy
FIB – Focused ion beam microscopy
FIM-AP – Field ion microscopy–atom probe
Flow birefringence
Fluorescence anisotropy
FLIM – Fluorescence lifetime imaging
Fluorescence microscopy
FOSPM – Feature-oriented scanning probe microscopy
FRET – Fluorescence resonance energy transfer
FRS – Forward Recoil Spectrometry, a synonym of ERD
FTICR or FT-MS – Fourier-transform ion cyclotron resonance or Fourier-transform mass spectrometry
FTIR – Fourier-transform infrared spectroscopy

G

GC-MS – Gas chromatography-mass spectrometry
GDMS – Glow discharge mass spectrometry
GDOS – Glow discharge optical spectroscopy
GISAXS – Grazing incidence small angle X-ray scattering
GIXD – Grazing incidence X-ray diffraction
GIXR – Grazing incidence X-ray reflectivity
GLC – Gas-liquid chromatography

H

HAADF – High angle annular dark-field imaging
HAS – Helium atom scattering
HPLC – High performance liquid chromatography
HREELS – High resolution electron energy loss spectroscopy
HREM – High-resolution electron microscopy
HRTEM – High-resolution transmission electron microscopy
HI-ERDA – Heavy-ion elastic recoil detection analysis
HE-PIXE – High-energy proton induced X-ray emission

I

IAES – Ion induced Auger electron spectroscopy
IBA – Ion beam analysis
IBIC – Ion beam induced charge microscopy
ICP-AES – Inductively coupled plasma atomic emission spectroscopy
ICP-MS – Inductively coupled plasma mass spectrometry
Immunofluorescence
ICR – Ion cyclotron resonance
IETS – Inelastic electron tunneling spectroscopy
IGA – Intelligent gravimetric analysis
IGF – Inert gas fusion
IIX – Ion induced X-ray analysis, see particle induced X-ray emission
INS – Ion neutralization spectroscopy
Inelastic neutron scattering
IRNDT – Infrared non-destructive testing of materials
IRS – Infrared spectroscopy
ISS – Ion scattering spectroscopy
ITC – Isothermal titration calorimetry
IVEM – Intermediate voltage electron microscopy

L

LALLS – Low-angle laser light scattering
LC-MS – Liquid chromatography-mass spectrometry
LEED – Low-energy electron diffraction
LEEM – Low-energy electron microscopy
LEIS – Low-energy ion scattering
LIBS – Laser induced breakdown spectroscopy
LOES – Laser optical emission spectroscopy
LS – Light (Raman) scattering

M

MALDI – Matrix-assisted laser desorption/ionization
MBE – Molecular beam epitaxy
MEIS – Medium energy ion scattering
MFM – Magnetic force microscopy
MIT – Magnetic induction tomography
MPM – Multiphoton fluorescence microscopy
MRFM – Magnetic resonance force microscopy
MRI – Magnetic resonance imaging
MS – Mass spectrometry
MS/MS – Tandem mass spectrometry
MSGE – Mechanically stimulated gas emission
Mössbauer spectroscopy
MTA – Microthermal analysis

N

NAA – Neutron activation analysis
ND – Neutron diffraction
NDP – Neutron depth profiling
NEXAFS – Near edge X-ray absorption fine structure
NIS – Nuclear inelastic scattering/absorption
NMR – Nuclear magnetic resonance spectroscopy
NOESY – Nuclear Overhauser effect spectroscopy
NRA – Nuclear reaction analysis
NSOM – Near-field optical microscopy

O

OBIC – Optical beam induced current
ODNMR – Optically detected magnetic resonance, see ESR or EPR
OES – Optical emission spectroscopy
Osmometry

P

PAS – Positron annihilation spectroscopy
Photoacoustic spectroscopy
PAT or PACT – Photoacoustic tomography or photoacoustic computed tomography
PAX – Photoemission of adsorbed xenon
PC or PCS – Photocurrent spectroscopy
Phase contrast microscopy
PhD – Photoelectron diffraction
PD – Photodesorption
PDEIS – Potentiodynamic electrochemical impedance spectroscopy
PDS – Photothermal deflection spectroscopy
PED – Photoelectron diffraction
PEELS – parallel electron energy loss spectroscopy
PEEM – Photoemission electron microscopy (or photoelectron emission microscopy)
PES – Photoelectron spectroscopy
PINEM – photon-induced near-field electron microscopy
PIGE – Particle (or proton) induced gamma-ray spectroscopy, see nuclear reaction analysis
PIXE – Particle (or proton) induced X-ray spectroscopy
PL – Photoluminescence
Porosimetry
Powder diffraction
PTMS – Photothermal microspectroscopy
PTS – Photothermal spectroscopy

Q

QENS – Quasielastic neutron scattering
QCM-D – Quartz crystal microbalance with dissipation monitoring

R

Raman spectroscopy
RAXRS – Resonant anomalous X-ray scattering
RBS – Rutherford backscattering spectrometry
REM – Reflection electron microscopy
RDS – Reflectance difference spectroscopy
RHEED – Reflection high energy electron diffraction
RIMS – Resonance ionization mass spectrometry
RIXS – Resonant inelastic X-ray scattering
RR spectroscopy – Resonance Raman spectroscopy

S

SAD – Selected area diffraction
SAED – Selected area electron diffraction
SAM – Scanning Auger microscopy
SANS – Small angle neutron scattering
SAXS – Small angle X-ray scattering
SCANIIR – Surface composition by analysis of neutral species and ion-impact radiation
SCEM – Scanning confocal electron microscopy
SE – Spectroscopic ellipsometry
SEC – Size exclusion chromatography
SEIRA – Surface enhanced infrared absorption spectroscopy
SEM – Scanning electron microscopy
SERS – Surface enhanced Raman spectroscopy
SERRS – Surface enhanced resonance Raman spectroscopy
SESANS – Spin Echo Small Angle Neutron Scattering
SEXAFS – Surface extended X-ray absorption fine structure
SICM – Scanning ion-conductance microscopy
SIL – Solid immersion lens
SIM – Solid immersion mirror
SIMS – Secondary ion mass spectrometry
SNMS – Sputtered neutral species mass spectrometry
SNOM – Scanning near-field optical microscopy
SPECT – Single-photon emission computed tomography
SPM – Scanning probe microscopy
SRM-CE/MS – Selected-reaction-monitoring capillary-electrophoresis mass-spectrometry
SSNMR – Solid-state nuclear magnetic resonance
Stark spectroscopy
STED – Stimulated emission depletion microscopy
STEM – Scanning transmission electron microscopy
STM – Scanning tunneling microscopy
STS – Scanning tunneling spectroscopy
SXRD – Surface X-ray diffraction

T

TAT or TACT – Thermoacoustic tomography or thermoacoustic computed tomography (see also photoacoustic tomography – PAT)
TEM – Transmission electron microscopy
TGA – Thermogravimetric analysis
TIKA – Transmitting ion kinetic analysis
TIMS – Thermal ionization mass spectrometry
TIRFM – Total internal reflection fluorescence microscopy
TLS – Photothermal lens spectroscopy, a type of photothermal spectroscopy
TMA – Thermomechanical analysis
TOF-MS – Time-of-flight mass spectrometry
Two-photon excitation microscopy
TXRF – Total reflection X-ray fluorescence analysis

U

Ultrasound attenuation spectroscopy
UPS – UV-photoelectron spectroscopy
USANS – Ultra small-angle neutron scattering
USAXS – Ultra small-angle X-ray scattering
UT – Ultrasonic testing
UV-Vis – Ultraviolet–visible spectroscopy

V

VEDIC – Video-enhanced differential interference contrast microscopy
Voltammetry

W

WAXS – Wide angle X-ray scattering
WDX or WDS – Wavelength dispersive X-ray spectroscopy

X

XAES – X-ray induced Auger electron spectroscopy
XANES – XANES, synonymous with NEXAFS (near edge X-ray absorption fine structure)
XAS – X-ray absorption spectroscopy
X-CTR – X-ray crystal truncation rod scattering
X-ray crystallography
XDS – X-ray diffuse scattering
XPEEM – X-ray photoelectron emission microscopy
XPS – X-ray photoelectron spectroscopy
XRD – X-ray diffraction
XRES – X-ray resonant exchange scattering
XRF – X-ray fluorescence analysis
XRR – X-ray reflectivity
XRS – X-ray Raman scattering
XSW – X-ray standing wave technique

See also

Characterization (materials science)

References

Callister, WD (2000). Materials Science and Engineering – An Introduction. London: John Wiley and Sons. ISBN 0-471-32013-7.
Yao, N, ed. (2007). Focused Ion Beam Systems: Basics and Applications. Cambridge, UK: Cambridge University Press. ISBN 978-0-521-83199-4.

Retrieved from "https://en.wikipedia.org/w/index.php?title=List_of_materials_analysis_methods&oldid=1222942943" Last edited on 8 May 2024, at 22:11

Languages

●فارسی ●Nederlands ●日本語

●This page was last edited on 8 May 2024, at 22:11 (UTC). ●Content is available under CC BY-SA 4.0 unless otherwise noted. ●Privacy policy ●About Wikipedia ●Disclaimers ●Contact Wikipedia ●Code of Conduct ●Developers ●Statistics ●Cookie statement ●Terms of Use ●Desktop