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Is there any reason the image isn't showing up on this page? The larger version doesn't seem to be working either. Might be I'm just missing something? -- TomPreuss 13:34, 5 Aug 2004 (UTC)
the work is perfect if i may add — Preceding unsigned comment added by 129.122.0.121 (talk) 12:03, 7 February 2022 (UTC)Reply
Shouldn't this page be listed under SEM? It's a pretty common abbreviation. --Michaeltoe 22:09, 4 Feb 2005 (UTC)
The use of a dedicated backscattered electron detector above the sample in a "doughnut" type arrangement, with the
That is all: the paragraph in the section 'Detection of backscattered electrons' ends abruptly. Seems like there's some half-editing... I can now see the paragraph fully, and no one has edited it!! Perhaps there was a problem in the browser I was using(in my college). Firefox proves itself to be THE best. :)
SundarKanna 20:03, 26 December 2005 (UTC)Reply
I removed the template {{FAOL|French|fr:Microscopie électronique à balayage}} because the French article lost its featured article status. Stefane 07:47, 21 March 2006 (UTC)Reply
What are secondary electrons? What does "escape" mean? Why do they "escape"? This section does not stand on its own, but relies on a careful reading of other sections. While I made some changes due to style and grammar in this section, I am still confused by its content. I don't want to change the article itself because of my lack of knowledge, but here is what I think it is trying to say. I have heavily interpreted what I read and even made educated guesses. Can anyone confirm/disconfirm my guesswork?
"An electron beam rasters (i.e. scans back and forth) over the surface of a material, which absorbs the energy. The material re-emits secondary electrons in every direction. An electron sensor known as a scintillator-photomultiplier, measures the intensity of the secondary electrons and converts it into a two-dimensional image with bright and dim regions. The most common imaging technique detects low energy (<50 eV) secondary electrons originating a few nanometers from the surface.
The brightness depends on the angle of the surface. If the beam is perpendicular to the surface, then the spotlighted region is as small as possible, which minimizes the number of electrons that escape. As the surface angle increases, the spotlighted area increases, and more secondary electrons will be emitted. Steep surfaces and edges appear brighter than flat surfaces, resulting in well-defined, three-dimensional images. This technique makes resolutions of less than 1 nm possible." — Preceding unsigned comment added by Dhskep (talk • contribs) 05:11, 6 April 2006 (UTC)Reply
What are secondary electrons? What does "escape" mean? Why do they "escape"?
— User:Dhskep
Secondary electrons are inelastically scattered electrons of low energy. Primary electrons interact with an electron in an atom of the material and kick it out, leaving a hole. Depending on where it is in the atom, this hole can lead to an xray emission, auger electron, blah blah. The primary electron loses energy in the interaction, then generally goes on its merry way. The ejected electron is the secondary, and it has very low energy, i.e. it is moving very slowly. There is nothing particular to the surface that is conducive to the production of secondaries, but because they move slowly, they can only escape from near the surface. They have a very short mean free path. Detection is done by attracting secondaries with (usually) two bias potentials. A large wire cage over the SE detector will have a variable bias, usually +/-300V to attract or repel SEs. Behind that is a scintillator which will be biased at 8-10kV. Secondary electrons are attracted to the cage, then the scintillator.
There can be additional complicating factors with SEs. Because the scintillator has line of sight exposure to the specimen, it also inadvertently detects BSEs. Additionally, SEs fit in two categories. SE1, generated by the impact of the primary beam, and SE2, generated by escaping BSEs. The SE1/SE2 problem can be mitigated by using lower accelerating voltages and the inadvertent BSEs can be mitigated by using filtered detectors (eg. Hitachi ExB, Zeiss ESB, JEOL r-filter, FEI yadayada). Those filtered detectors are only available on FESEMs, probably for market segmentation and cost reasons. --137.82.22.226 (talk) 16:52, 3 December 2019 (UTC)Reply
I came across an orphan about OIM (apparently stands for orientation imaging microscopy). Can some one try to verify the information in it? Here: Orientation imaging microscopy (which is where I had to move it to make way for an "OIM" disambiguation page. — User:Donama 04:33, 17 May 2006 (UTC)Reply
Can somebody give me the construction and the electronics involved in electron microscopy? —Preceding unsigned comment added by 220.225.87.34 (talk • contribs) 06:25, 11 June 2007 (UTC)Reply
The reference to Alan Nelson's patent is irrelevant as there has never been any implementation of this approach to an environmental SEM either in laboratory equipment
or in commercial instruments, and no published reference to a refereed journal exists. In contrast, the patent:
U.S. Patent No. 4,823,006, filed Feb. 19, 1988. Integrated electron optical/differential pumping imaging signal detection system for an environmental scanning electron microscope. Inventors: G.D. Danilatos, G.C. Lewis. Assignee: ElectroScan Corporation.
describes the first commercial ESEM imlementation by ElectroScan. The latter was based on prior Danilatos works as listed in http://www.danilatos.com. In addition to the differential pumping and electron detection techniques described by the first Danilatos reference provided in the present entry, the commercial ESEM has made extensive use of the newly invented system of a gaseous detection device as comprehensively described by:
Danilatos, G.D. (1990). Theory of the Gaseous Detector Device in the ESEM in Advances in Electronics and Electron Physics, Academic Press, Vol. 78:1-102.
The Alan Nelson patent inappropriately employs a series of apertures with trapped air in the cavities between them. As a result, the electron beam would suffer significant losses before it can be usefully employed in the specimen chamber. At any rate, Alan Nelson by no means should be referenced as a contributor to the development of ESEM, let alone as an initiator of this technology. In contrast, Danilatos preceded with his first patent and papers on ESEM in 1979. It is therefore proposed to amend the references accordingly.
Esem0 05:40, 8 July 2007 (UTC) Esem0 05:43, 8 July 2007 (UTC) Esem0 05:45, 8 July 2007 (UTC)Reply
Esem0 04:11, 10 July 2007 (UTC) Esem0 04:12, 10 July 2007 (UTC)Reply
I've been looking through some of the imaging articles, and many appear to be missing major concepts fundamental to the instrument. For example, SEMs are known for their amazing depth of field, yet this term is not used at all in this article. Is there something I don't know about SEMs or Wikipedia and imaging articles that is a reason for omitting this?
it would be very nice if resource for downloadable SEM images On an archived bundle (such as rar or zip) also put here as the resource for people yo get Free SEM images on a specific category, such as human cells or parasitology Etc.
ive been looking anywhere to get such resource, and nothing better than here. But i wish a can find The free image bundled as i mention. —Preceding unsigned comment added by Kuplukjaya (talk • contribs) 07:06, 25 March 2008 (UTC) Kuplukjaya (talk) 07:13, 25 March 2008 (UTC)Reply
This edit changed a fair bit of text, and seems to have removed some info, as well as adding some. Can someone look at this? Should it simply be reverted? —Pengo 01:11, 30 March 2008 (UTC)Reply
There are many poor quality SEM images on Wikipedia for some reason. I removed some from the gallery for this article, because there are a sufficient number of better quality or useful images. The one of the topo/atomic number contrast should also be removed when a better image comes up.
The first one I removed is of the polyester. This image has serious charging artifacts, creating the ruinous line across the middle of the image, it's in focus almost nowhere, and it has lousy depth of field (of course, since it's in focus almost nowhere). A longer working distance, a smaller aperture, a smaller probe size, lower KV, better coating, many things would have made this a better image. It's fine for the polyester fiber article for now, but a better one should be captured or found, as this one has too many problems with it to be used in an encyclopedia for anything other than an article on SEM artifacts (which it would be good for).
The diatoms are out of focus. There's no point to the image. It's not in focus anywhere in the depth of focus of the image.
The red blood cells should be removed also, when they can be replaced with a better image. Red blood cells are easy to shoot on an SEM, and this image is far too noisy to be considered for production anywhere outside of Wikipedia--it's too old. However, because red blood cells look totally cool on SEM (versus TEM), it's okay to leave this very noisy image in for now. They're a standard.
The nematocyst is too low resolution to be of any use. It should be replaced, also.
The Drosophila melanogaster body is very poorly preserved, rather than life-like, there's excessive charging to the point of putting a bright white lightening bolt through the image, and the carbon dag substrate consumes an unwieldy portion of the image. However, this is a basic subject in SEM, like red blood cells. Its compound eye is completely out of focus, also.
The asbestos fibers should be photoshopped to remove the charging artifacts, if left in. The picture is not compelling or illustrative of anything other than the fact that SEM is used to look at asbestos fibres. I think it is rather common.
Probably the same public domain sources could be searched for better images.
An SEM image should be in focus. This does not require an expert microscopist to discern. It's either in focus or it's not. TEM images can be much more subjective and demanding of expert eyes to tell quality. Especially with biological specimens, if it looks out of focus, if the insect is collapsed and dessicated, it's not a good image. It's more difficult with materials specimens, but there are few of any of these of any quality on Wikipedia.
--Blechnic (talk) 06:27, 8 April 2008 (UTC)Reply
Additional question on images. Does someone have the original source material for the photoresist? It says it is taken at 1KV, it also has "standing waves" and "DSM" on the bottom. 1 KV is very unusual for SEM, so it should be elaborated in the caption. --Blechnic (talk) 07:01, 8 April 2008 (UTC)Reply
This image is in focus in over less than 10% of the picture. It has no depth of field--it might as well have been shot on a light microscope. It has ugly charging artifacts. The substrate (cracked dag?) is hideous. The information on the bottom shows what went wrong: too short a depth of field, too high a KV, add the blown out areas, and the charging artifacts and you wind up with not much worth sharing. Just because it's a secondary electron micrograph doesn't mean it has to be on Wikipedia. --Blechnic (talk) 07:16, 8 April 2008 (UTC)Reply
Well, stop moaning about images and replace the ones you object to with your own. I have been using SEM, ESEM and OM for many years and live with the problems you mention. If only we all lived in a perfect world! Perhaps you should write a new article on "artefacts in SEM". Peterlewis (talk) 08:07, 8 April 2008 (UTC)Reply
My "attitude" and "stubborness?" Are we discussing the article or attacking me personally? I look down on those I disagree with? Where's your proof of that? I'm too short. There is no need to put any crappy image on Wikipedia for any reason. It's not a dumping or holding ground for garbage, particularly when the gallery can be filled nicely with a smaller but sufficient number of SEM micrographs that actually show something. If you wish to discuss me and your guesses about me personally and attack me personally find somewhere and some way else to do it. This is a discussion page for the SEM article. The article was improved by removing the images, rather than by littering it with crap by keeping the images in. The existing ones do not illustrate unique subjects. I left the ones that do this in. The article doesn't have to be for experts to show a decent SEM micrograph. That is the beauty of an SEM, even non-experts can look at a beautiful micrograph, like the ones of the arthropod eyes, and tell they are beautiful and without the artifacts of bad micrographs. Littering Wikipedia with crap in articles simply because someone uploaded it isn't writing an encyclopedia. Peter Lewis insists the crap must stay, so it should be identified as crap. In my opinion a smaller gallery of a well-chosen variety of good images would be a much better choice, but Peter Lewis wants the bad micrographs, so I agreed to allow them with the captions. How about I divide the gallery in two? Example electron micrographs and trash? Get off the topic of me. --Blechnic (talk) 04:44, 11 April 2008 (UTC)Reply
This, right here, is a nice gallery of notable, good, or example electron micrographs:
Adding garbage to the article, simply because it exists on Wikipedia, does not make this a better article, or a better gallery. It is just poor quality, unpublishable, micrographs. Why publish them on Wikipedia? Is this a dumping ground for bad snapshots? No, this is an encyclopedia article. More is not better, when the more is without additive value. Adding poor quality micrographs that fail to illustrate anything but their own poor quality is not necessary for an article on SEM. I bet the photography and camera articles don't have example trash images in their galleries. It's absurd. --Blechnic (talk) 04:51, 11 April 2008 (UTC)Reply
"Gold coating may be regarded as a semi-destructive process since removal of a gold coating requires aggressive chemicals such as potassium cyanide or aqua regia, although this would only be required in practise if a specimen has high intrinsic value, as in an archaeological artefact."
Is there an example of a museum coating an archaeological artefact with "high intrinsic value" then using arsenic of something to remove the gold? I pretty much only work with natural history specimens, often type specimens, so coating is simply not done, so it's hard to imagine damaging a precious specimen by coating it to capture an image. An example would go a long way for this sentence. --Blechnic (talk) 02:40, 23 April 2008 (UTC)Reply
Also, I thought "Environmental SEM" was a trademarked name? If so, should we be using it generically in an encyclopedia, or does this matter?
"Working with the method is easier because the sample chamber is very large, and control is usually completely computer controlled."
Always very large? I just visited a lab today with an old Zeiss SEM (tungsten filament) that has a huge sample chamber. The variable vacuum SEM I use has a pretty big sample chamber, but it's not huge compared to my other SEMs. And, "completely computer controlled" is not a function of low vacuum variable pressure SEMs, it's a function of what you ordered when you buy it. It's conceptually new so it comes with a computer interface, but the cheaper versions can come with mechanical controls if you're an institution with a finite budget and a high need.
"Coating is thus unnecessary, and X-ray analysis unhindered. Sample manipulation within the specimen chamber is always more difficult than in optical microscopy, however, and colour rendition is absent."
Huh? Why do we go to comparing an environmental SEMs chamber manipulation with that of a light microscope? Is it easier in a conventional SEM. And, no, it's not "always more difficult than in optical microscopy!" It depends upon the optical microscope and the SEM. Last week it took me all day to set up some light microscope images and half an hour to shoot a few dozen high resolution bacterial images on an SEM, mostly because of the time spent aligning the optical microscope's stage for collecting data.\
"Colour rendition is absent" in an environmental SEM? Well, why would anyone use them if they can't get color? It's also absent in all electron microscopy. This section needs to be about the ESEM, not just filled with general information to make it thicker. Maybe it was just copied from another article merged with this?
I'm beginning to think someone writing this article is selling or investing in ESEMs. However, it's not necessarily to internally link every occurrence to its section in this article. People will still buy them without the excessive linking.
--Blechnic (talk) 02:40, 23 April 2008 (UTC)Reply
Indeed, the removal of gold-coating is such a minute detail in the big picture of SEM, weird to have it here. I agree that the link of ESEM to FEI company should be deleted. They do not have the monopoly of it any more. However, the name of ElectroScan should remain as it is historically important. The names ESEM and Environmental SEM are generic terms in use for about three decades long before ElectroScan claimed it as a trademark (this term was actually first introduced by Danilatos in 1980). Therefore, the fact that a commercial company successfully but "unlawfully" managed to trademark it for some time has created a misconception which should not be allowed to leave a permanent imprint in the encyclopedia. Commercialism should be struck out. If you were to delete ESEM, then what else is there to replace it with? Perhaps, VPSEM which is used by a competitor to FEI to also promote ESEM (who use ESEM as generic term in their brochures); or "Wet-SEM" adopted yet by another competitor? Or "Natural SEM" by another one, or "Bio-SEM" once used by AMRAY? The encyclopedia should not be trapped by any on these commercialisms with their corresponding catchwords. However, ESEM is an independent generic term naturally evolved from academic research. Manufacturers have unfortunately created a lot of confusion around, and many workers in the field have been misled. It would be nice if all involved in this subject took some time to study the relevant literature. There are many misconceptions around and things should be cleared once and for all. This forum is a good place to start. Please comment before action is taken to make the change - or the first proposer (or other) proceed to make it. Esem0 (talk) 00:44, 26 April 2008 (UTC)Reply
The trademark ESEM is dead since March 22, 1999, according to US Patent and Trademark survey (something you could have done yourself, if you wanted to really contribute). Therefore, ESEM is not a trademark, it is generic per previous statement. I thought my comments would be in agreement with you and that I was following up with your request, but you seem to be pleased with nothing. Please make an effort to be constructive and stop picking on issues or persons that don't deserve your aggressiveness. Just consent for once. Esem0 (talk) 02:42, 26 April 2008 (UTC)Reply
SEMs don't have objective lenses. The signals from the object are collected by various detectors and images formed from the detection of these signals not from the final lens. The final lens or focusing lens is not an objective lens. --Blechnic (talk) 02:53, 23 April 2008 (UTC)Reply
It's not technically correct to call the final lens in an SEM the objective, but the electron microscopy community consensus seems to be that it's a convenient term --137.82.22.226 (talk) 18:12, 3 December 2019 (UTC)Reply
Find a source that shows otherwise, rather than your original resource into properties of formaldehyde. I thought you did EM? This is a strange edit for someone who actually does EM. Where exactly are you getting this information from?
There is no need to keep your incorrect spelling of proprties, whatever the decision about formaldehyde/paraformaldehyde.
--Blechnic (talk) 02:03, 20 July 2008 (UTC)Reply
You didn't read these at all, did you?
Why not go ahead and read what you just linked to, an article about using paraformaldehyde (Karnovsky's, something I've used a lot and not much changed from the original), that doesn't mention formaldehyde at all, and an article about why commercial formaldehyde is not used, but how it is
"the regular practice for at least 35 years has been simply to heat the paraformaldehyde to 60C in water containing the salts used to buffer the solution to pH 7.2 to 7.6. "
or
"A solution of formaldehyde prepared from paraformaldehyde, which does not initially contain any methanol, is commonly used in fixatives for electron microscopy and in research applications. Satisfactory ultrastructural preservation is, however, also seen in tissues fixed in buffered formaldehyde generated from formalin (Carson, et al., 1973)."
So, back to the original request. A reference that you can cite that lists formaldehyde as the fixative of choice, go for the regular commercial grade, also, to explain why it is used. Rather than your own OR from sources that contradict what you say and that you appear to have not read. --Blechnic (talk) 09:43, 20 July 2008 (UTC)Reply
A single 1985 article on fixing plants? Well, I'll get a copy and read it. It better say that "formaldehyde" is the one of choice. You can't use one of your textbooks? I'll be sure to check mine. Heck, the article's by Russell, is this what he says in his textbook, which is later than 1985? --Blechnic (talk) 15:15, 21 July 2008 (UTC)Reply
References
The article cites Karnovsky, M. J. (1965). "A formaldehyde-glutaraldehyde fixative of high osmolality for use in electron microscopy". Journal of Cell Biology. 27: 137A–138A. {{cite journal}}
: Cite has empty unknown parameters: |month=
and |coauthors=
(help). However, I wasn't able to find this article in the journal's archive. Is there some mistake? ––Bender235 (talk) 09:23, 12 August 2008 (UTC)Reply
It seems like the article Electron microprobe has substantial overlap with this one. In fact, between this article and the EDS article, I think almost everything in Electron microprobe is covered, but better. Should Electron microprobe be merged and then deleted? Or should we decide that parts of this article should be moved to Electron microprobe and vice-versa? I don't know, but I'm hoping someone here will do something about this. Thanks!! :-) --Steve (talk) 04:39, 30 January 2009 (UTC)Reply
Did they have to coat the snowflake with gold before scanning? Would be nice to mention it in the caption since the coating-of-gold was a surprise to me when I visited this article. Tempshill (talk) 06:36, 7 February 2009 (UTC)Reply
I'm an amateur, but in my experience with gold or carbon sputter coating, the thickness is a few nanometers. In the "biological samples" section, it says: "However, the coating has a thickness of a few micrometres." I think this is a typo, but I'm unfamiliar with biological samples so I thought I'd check here before I changed it. Jermor (talk) 20:51, 19 February 2010 (UTC)Reply
Is there also not in existence a transmission scanning electron microscope? If so, can someone more knowledgeable write upsomething about it? Old_Wombat (talk) 09:23, 28 October 2011 (UTC)Reply
Not knowing enough about the STEM to comment on the quality of the article, the only point I was trying to make is that the SEM article should have some kind of link/pointer to the STEM one. Old_Wombat (talk) 08:48, 30 October 2011 (UTC)Reply
Added this under the transmission sem heading. --137.82.22.226 (talk) 18:13, 3 December 2019 (UTC)Reply
I strongly believe all altered (MEANS COLORED) micrographs should be removed. — Preceding unsigned comment added by Vniizht (talk • contribs) 22:07, 3 February 2012 (UTC)Reply
I'm also concerned that members of the public think SEM images come colored, and that the colors mean something important ("Oh, that cell is red, which told the researchers that it was cancer!"). Rather than remove them, however, I'd like to see a section on colored images, talking about how it is done (by hand using a photo editing tool). -- 100.0.73.17 (talk) 11:44, 10 December 2012 (UTC)Reply
1. 300 V - 1kV is a new "normal" voltage for SEM. Low voltage and in-lens SEM is a way to go now. 10 kV is a way to hight voltage even for traditional SEM. Too strong edge effect and too high volume of signal generation. I myself do not go above 5 kV for most applications.
2. For at least 15 years there were no new SEMs with CRT. We cannot stick to explanations of image formation with CRT scopes any more. Time to move forward.
So, your "undo" of my editing looks too outdated.
I am waiting for your reply; otherwise I will reverse it back. Thanks, Chivesud (talk) 15:30, 17 February 2012 (UTC)Reply
Reverted to my version. Chivesud (talk) 20:00, 22 February 2012 (UTC)Reply
Materialscientist, I am sorry for even greater delay.
Unfortunately, you are very wrong in your habit to “go to nearly the highest microscope voltage” for better resolution. First, usually very few micrographs are made at or close to resolution limit. Second, high voltage will make you lose fine details at intermediate magnifications. For example, river patterns on grains of fragile fracture of steel will greatly decrease in contrast at unnecessary elevated voltages. Current trend is to use as low voltage as possible for any kind of specimens. On a Microscopy listserver (of American Microscopy Society) you can find hard core fanatics of low voltage observations. I myself believe that voltage should depend on task, not on some dogma. For example, for my latest paper I used 5 kV voltages for coated specimens, 1 kV for not coated, 5-25 kV for BSE images, 2 kV for X-ray analysis (elements of interest C and O). Only very old or very misaligned microscopes demand high voltages for any work. Chivesud (talk) 14:00, 18 March 2012 (UTC)Reply
"1. 300 V - 1kV is a new "normal" voltage for SEM. Low voltage and in-lens SEM is a way to go now. 10 kV is a way to hight voltage even for traditional SEM. Too strong edge effect and too high volume of signal generation. I myself do not go above 5 kV for most applications."
This is a ridiculous statement. Yes, 300V to 1kV is the new normal in a hot shit top of the line field emission SEM when imaging light element samples at short working distance. 5kV is still the practical/workable lower limit for most users stuck with even brand new tungsten systems, which still vastly outnumber the FESEMs in the field. More importantly, there isn't a "right" accelerating voltage for all samples at all times. How you hammer a slug of stainless steel is going to be very different from how you approach a nanotube forest. For x-rays, the critical excitation energy must be accounted for.
"For highest resolution any specimen will have an optimum accelerating voltage in the range 2-5 kV where the best combination of signal to noise and resolution can be obtained"
Nah, dude. Some of us are still using thermionic emitters without in-column detectors. Get out of the ivory tower.--137.82.22.226 (talk) 21:29, 3 December 2019 (UTC)Reply
Hi Plantsurfer,
Colored pictures ARE NOT SUITED FOR SCIENTIFIC PUBLICATIONS. Period. Please, do not revert again my editing on the colored pictures. Thank you,
Chivesud (talk) 01:58, 24 March 2012 (UTC)Reply
http://www.nature.com/nature/journal/v434/n7036/full/434952a.html "Changes to selected parts of an image, such as brightening one cell in an entire field or scrubbing out an ugly blemish, are prohibited." - This citation can be applied to pseudo coloring.
Chivesud (talk) 18:33, 3 April 2012 (UTC)Reply
See also http://www.nature.com/nphys/journal/v6/n11/fig_tab/nphys1767_F3.html from Nature Physics 6, 879-882 (2010) and Yamada, M, Suzuki, T., Oho E. and Matsushima, H. (1998) Colour scanning electron microscopy of peltate glandular trichomes of fresh developing hops (Humulus lupulus L.). Journal of Electron Microscopy 47 (5) 539-542. An example of a colour anaglyph occurs in I. Tatar et al. (2004) Circumventricular organs of rats . . . an anaglyphic SEM study. Neuroanatomy 3, 35-37. Applied Surface Science 57, (12), 1 April 2011, Pages 5208–5212 contains an example of an SEM image overlaid with colours to show the distribution of EDX signals from three different elements. This kind of presentation is common. Another relevant link: http://www.ncbi.nlm.nih.gov/pubmed/20638857 Plantsurfer (talk) 20:21, 24 March 2012 (UTC)Reply
Hi Plantsurfer, I agree that paper from The Plant Cell has useful utilization of coloring: it helps to calculate area and perimeter of cells (I have one paper published with similar coloring). Nature rather disappointed me: no justification for coloring image. Yamada did not used pseudo colors, he just combined optical and SEM images. Anaglyphs are still monochrome images – one red and one cyan. And we do not discuss X-ray data presentation. The last paper, from Micron, is rather childish; it is the Micron way to publish such a nonsense. By the way, I like coloring SEM pictures… So, colored images can look nice, but they should be avoided in publications.
Chivesud (talk) 19:03, 3 April 2012 (UTC)Reply
If a knowledgeable person could consolidate the two duplicate ESEM sections, it would be great — Preceding unsigned comment added by 99.162.70.214 (talk) 16:39, 8 April 2012 (UTC)Reply
I think the few words spared for Manfred von Ardenne do not make justice for the father of scanning electron microscope. Specifically, the phrase "but never made a practical instrument" portrays a denial for his great achievements. He actually constructed a prototype SEM and produced the first ever scanning electron micrographs as reported in the second part of his "Elektronen-Rastermikroskop". He was not a manufacturer to develop and produce a machine for the general public. This does not deserve him any negativity after the world has enjoyed the outcomes of his innovation for so many decades. We are not qualified judges to state that "he never made a practical instrument" except to state the opposite. He was actually both a great experimentalist and builder of electron microscopes, and a great theoretician. He is the equal to Ruska but not easily recognized as such.--Esem0 (talk) 13:33, 9 August 2012 (UTC)Reply
Does anyone have or know of a bona fide multichannel color SEM image that can be used in the article without copyright problems. Plantsurfer (talk) 12:23, 13 December 2012 (UTC)Reply
Search results of the article: 9 counts for "an SEM" and 7 counts for "a SEM". It should be consistent and changed to "an SEM", according to grammar rules and for example the entry for "indefinite articles" in Wikipedia: "The form an is used before words that begin with a vowel sound (even if spelled with an initial consonant, as in an hour), and a before words that begin with a consonant sound (even if spelled with a vowel, as in a European)"Basshannes (talk) 11:41, 17 November 2015 (UTC)Reply
Can someone clarify the following?
"...eliminate the chromatic aberration otherwise inherent in the electron microscope"
Chromatic aberration is a potential defect in glass lenses, not in an SEM. — Preceding unsigned comment added by 208.59.128.48 (talk) 12:05, 24 October 2016 (UTC)Reply
An individual editor's expertise in instrumentation for the semiconductor industry is not sufficient to establish that particular information is reliable for Wikipedia. Please provide a reliable source. "The Citation needed template is intended for use when there is a general question of the verifiability of a statement, or when an editor believes that a reference verifying the statement should be provided." Sucb a source probably contains more useful information about SEMs in the semiconductor industry, and I can't find one. --2600:387:6:807:0:0:0:6A (talk) 12:11, 26 May 2017 (UTC)Reply
The source does not say eggshells can be put in SEM with little further treatment, whatever that means, it says this Southwestern US collection of 600 year old eggshells stored for 40 years were rinsed with distilled water and carbon coated before being examined on the SEM. --2601:648:8503:4467:B8A4:9B4E:66AB:4469 (talk) 13:02, 26 May 2017 (UTC)Reply
That spider kicked me from the chair. Maybe another picture or just a leg? — Preceding unsigned comment added by Dnvuma (talk • contribs) 13:02, 19 October 2019 (UTC)Reply